Reliability characterization of organic ultra low k film using ramp voltage breakdown

Proceedings - Electrochemical Society

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Main Authors:	Krishnamoorthy, A., Murthy, B.R., Yiang, K.Y., Yoo, W.J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/71606
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-71606
record_format	dspace
spelling	sg-nus-scholar.10635-716062015-01-09T19:37:37Z Reliability characterization of organic ultra low k film using ramp voltage breakdown Krishnamoorthy, A. Murthy, B.R. Yiang, K.Y. Yoo, W.J. ELECTRICAL & COMPUTER ENGINEERING Proceedings - Electrochemical Society 10 232-236 2014-06-19T03:25:40Z 2014-06-19T03:25:40Z 2003 Conference Paper Krishnamoorthy, A.,Murthy, B.R.,Yiang, K.Y.,Yoo, W.J. (2003). Reliability characterization of organic ultra low k film using ramp voltage breakdown. Proceedings - Electrochemical Society 10 : 232-236. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/71606 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Proceedings - Electrochemical Society
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Krishnamoorthy, A. Murthy, B.R. Yiang, K.Y. Yoo, W.J.
format	Conference or Workshop Item
author	Krishnamoorthy, A. Murthy, B.R. Yiang, K.Y. Yoo, W.J.
spellingShingle	Krishnamoorthy, A. Murthy, B.R. Yiang, K.Y. Yoo, W.J. Reliability characterization of organic ultra low k film using ramp voltage breakdown
author_sort	Krishnamoorthy, A.
title	Reliability characterization of organic ultra low k film using ramp voltage breakdown
title_short	Reliability characterization of organic ultra low k film using ramp voltage breakdown
title_full	Reliability characterization of organic ultra low k film using ramp voltage breakdown
title_fullStr	Reliability characterization of organic ultra low k film using ramp voltage breakdown
title_full_unstemmed	Reliability characterization of organic ultra low k film using ramp voltage breakdown
title_sort	reliability characterization of organic ultra low k film using ramp voltage breakdown
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/71606
_version_	1681087414351691776

Reliability characterization of organic ultra low k film using ramp voltage breakdown

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