Reliability characterization of organic ultra low k film using ramp voltage breakdown

Proceedings - Electrochemical Society

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Bibliographic Details
Main Authors:	Krishnamoorthy, A., Murthy, B.R., Yiang, K.Y., Yoo, W.J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/71606
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Institution:	National University of Singapore

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