Reliability characterization of organic ultra low k film using ramp voltage breakdown

Reliability characterization of organic ultra low k film using ramp voltage breakdown

Proceedings - Electrochemical Society

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Bibliographic Details
Main Authors: Krishnamoorthy, A., Murthy, B.R., Yiang, K.Y., Yoo, W.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/71606
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/71606

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