Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors
IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
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sg-nus-scholar.10635-725252015-04-06T08:11:58Z Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors Ooi, J.A. Ling, C.H. ELECTRICAL ENGINEERING IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 19-22 00267 2014-06-19T05:09:02Z 2014-06-19T05:09:02Z 1997 Conference Paper Ooi, J.A.,Ling, C.H. (1997). Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE : 19-22. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72525 NOT_IN_WOS Scopus |
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IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Ooi, J.A. Ling, C.H. |
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Conference or Workshop Item |
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Ooi, J.A. Ling, C.H. |
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Ooi, J.A. Ling, C.H. Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
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Ooi, J.A. |
title |
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
title_short |
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
title_full |
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
title_fullStr |
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
title_full_unstemmed |
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
title_sort |
comparison of fowler-nordheim stress on tungsten polycided and non-polycided mos capacitors |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/72525 |
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