Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors

IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE

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Main Authors: Ooi, J.A., Ling, C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72525
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-725252015-04-06T08:11:58Z Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors Ooi, J.A. Ling, C.H. ELECTRICAL ENGINEERING IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 19-22 00267 2014-06-19T05:09:02Z 2014-06-19T05:09:02Z 1997 Conference Paper Ooi, J.A.,Ling, C.H. (1997). Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE : 19-22. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72525 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Ooi, J.A.
Ling, C.H.
format Conference or Workshop Item
author Ooi, J.A.
Ling, C.H.
spellingShingle Ooi, J.A.
Ling, C.H.
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors
author_sort Ooi, J.A.
title Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors
title_short Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors
title_full Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors
title_fullStr Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors
title_full_unstemmed Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors
title_sort comparison of fowler-nordheim stress on tungsten polycided and non-polycided mos capacitors
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/72525
_version_ 1681087581618438144