Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors
IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
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Main Authors: | Ooi, J.A., Ling, C.H. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/72525 |
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Institution: | National University of Singapore |
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