Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors
IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
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| التنسيق: | Conference or Workshop Item |
| منشور في: |
2014
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| الوصول للمادة أونلاين: | http://scholarbank.nus.edu.sg/handle/10635/72525 |
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| المؤسسة: | National University of Singapore |
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sg-nus-scholar.10635-725252024-11-08T18:01:37Z Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors Ooi, J.A. Ling, C.H. ELECTRICAL ENGINEERING IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE 19-22 00267 2014-06-19T05:09:02Z 2014-06-19T05:09:02Z 1997 Conference Paper Ooi, J.A.,Ling, C.H. (1997). Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE : 19-22. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72525 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ooi, J.A. Ling, C.H. |
| format |
Conference or Workshop Item |
| author |
Ooi, J.A. Ling, C.H. |
| spellingShingle |
Ooi, J.A. Ling, C.H. Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
| author_sort |
Ooi, J.A. |
| title |
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
| title_short |
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
| title_full |
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
| title_fullStr |
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
| title_full_unstemmed |
Comparison of Fowler-Nordheim stress on tungsten polycided and non-polycided MOS capacitors |
| title_sort |
comparison of fowler-nordheim stress on tungsten polycided and non-polycided mos capacitors |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/72525 |
| _version_ |
1821230197156872192 |