Temperature Measurement on Micromachined IR Bolometers Using an Infrared Microscope

Conference Proceedings from the International Symposium for Testing and Failure Analysis

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Bibliographic Details
Main Authors: Trigg, A.D., Sridhar, U., Lee, H.S., Karunasiri, G.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72963
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Institution: National University of Singapore

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