Static secondary ion mass spectrometry (SIMS) of polyanilines: A preliminary study
Synthetic Metals
Saved in:
Main Authors: | Chan, H.S.O., Ang, S.G., Ho, P.K.H., Johnson, D. |
---|---|
Other Authors: | CHEMISTRY |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/77049 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
High depth resolution profiling for magnetic-sector secondary ion mass spectrometry (SIMS)
by: LIU RONG
Published: (2011) -
A study of the effects of ultralow energy secondary ion mass spectrometry (SIMS) on surface transient and depth resolution
by: AB RAZAK BIN CHANBASHA
Published: (2010) -
A structural investigation of polyvinylpyridine charge transfer complexes by X-ray photoelectron spectroscopy and static secondary ion mass spectrometry
by: Loh, F.C., et al.
Published: (2014) -
Investigation of titanium silicide formation using secondary ion mass spectrometry
by: Wee, Andrew T.S., et al.
Published: (2014) -
BACKSIDE SAMPLE PREPARATION ON BULK SUBSTRATE FOR SECONDARY ION MASS SPECTROSCOPY (SIMS) ANALYSIS
by: ZHU JIANFENG
Published: (2019)