Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance

Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance

Japanese Journal of Applied Physics, Part 2: Letters

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Main Author: Ling, C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/80393
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-803932015-04-06T09:38:47Z Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance Ling, C.H. ELECTRICAL ENGINEERING Japanese Journal of Applied Physics, Part 2: Letters 32 10 A L1371-L1373 JAPLD 2014-10-07T02:57:02Z 2014-10-07T02:57:02Z 1993-10-01 Article Ling, C.H. (1993-10-01). Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance. Japanese Journal of Applied Physics, Part 2: Letters 32 (10 A) : L1371-L1373. ScholarBank@NUS Repository. 00214922 http://scholarbank.nus.edu.sg/handle/10635/80393 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Japanese Journal of Applied Physics, Part 2: Letters
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Ling, C.H.
format Article
author Ling, C.H.
spellingShingle Ling, C.H.
Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance
author_sort Ling, C.H.
title Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance
title_short Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance
title_full Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance
title_fullStr Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance
title_full_unstemmed Electron trapping and interface state generation in PMOSFET's: Results from gate capacitance
title_sort electron trapping and interface state generation in pmosfet's: results from gate capacitance
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/80393
_version_ 1681088879263744000

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