Logarithmic time dependence of pMOSFET degradation observed from gate capacitance

Electronics Letters

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Main Authors:	Ling, C.H., Yeow, Y.T., Ah, L.K., Yung, W.H., Choi, W.K.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/80684
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-806842015-02-11T04:44:46Z Logarithmic time dependence of pMOSFET degradation observed from gate capacitance Ling, C.H. Yeow, Y.T. Ah, L.K. Yung, W.H. Choi, W.K. ELECTRICAL ENGINEERING Electronics Letters 29 4 418-420 ELLEA 2014-10-07T03:00:11Z 2014-10-07T03:00:11Z 1993-01-01 Article Ling, C.H.,Yeow, Y.T.,Ah, L.K.,Yung, W.H.,Choi, W.K. (1993-01-01). Logarithmic time dependence of pMOSFET degradation observed from gate capacitance. Electronics Letters 29 (4) : 418-420. ScholarBank@NUS Repository. 00135194 http://scholarbank.nus.edu.sg/handle/10635/80684 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Electronics Letters
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Ling, C.H. Yeow, Y.T. Ah, L.K. Yung, W.H. Choi, W.K.
format	Article
author	Ling, C.H. Yeow, Y.T. Ah, L.K. Yung, W.H. Choi, W.K.
spellingShingle	Ling, C.H. Yeow, Y.T. Ah, L.K. Yung, W.H. Choi, W.K. Logarithmic time dependence of pMOSFET degradation observed from gate capacitance
author_sort	Ling, C.H.
title	Logarithmic time dependence of pMOSFET degradation observed from gate capacitance
title_short	Logarithmic time dependence of pMOSFET degradation observed from gate capacitance
title_full	Logarithmic time dependence of pMOSFET degradation observed from gate capacitance
title_fullStr	Logarithmic time dependence of pMOSFET degradation observed from gate capacitance
title_full_unstemmed	Logarithmic time dependence of pMOSFET degradation observed from gate capacitance
title_sort	logarithmic time dependence of pmosfet degradation observed from gate capacitance
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/80684
_version_	1681088933449957376

Logarithmic time dependence of pMOSFET degradation observed from gate capacitance

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