Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias
Japanese Journal of Applied Physics, Part 2: Letters
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2014
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sg-nus-scholar.10635-810772024-11-14T01:25:05Z Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias Ang, Chew-Hoe Ling, Chung-Ho Cheng, Zhi-Yuan Kim, Sun-Jung Cho, Byung-Jin ELECTRICAL ENGINEERING Japanese Journal of Applied Physics, Part 2: Letters 39 7 L757-L759 JAPLD 2014-10-07T03:04:24Z 2014-10-07T03:04:24Z 2000 Article Ang, Chew-Hoe,Ling, Chung-Ho,Cheng, Zhi-Yuan,Kim, Sun-Jung,Cho, Byung-Jin (2000). Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias. Japanese Journal of Applied Physics, Part 2: Letters 39 (7) : L757-L759. ScholarBank@NUS Repository. 00214922 http://scholarbank.nus.edu.sg/handle/10635/81077 NOT_IN_WOS Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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| description |
Japanese Journal of Applied Physics, Part 2: Letters |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ang, Chew-Hoe Ling, Chung-Ho Cheng, Zhi-Yuan Kim, Sun-Jung Cho, Byung-Jin |
| format |
Article |
| author |
Ang, Chew-Hoe Ling, Chung-Ho Cheng, Zhi-Yuan Kim, Sun-Jung Cho, Byung-Jin |
| spellingShingle |
Ang, Chew-Hoe Ling, Chung-Ho Cheng, Zhi-Yuan Kim, Sun-Jung Cho, Byung-Jin Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias |
| author_sort |
Ang, Chew-Hoe |
| title |
Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias |
| title_short |
Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias |
| title_full |
Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias |
| title_fullStr |
Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias |
| title_full_unstemmed |
Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias |
| title_sort |
reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/81077 |
| _version_ |
1821210649063063552 |