Trap generation in CVD SiO2 subjected to 253.7nm ultraviolet irradiation

• Main Authors: Ling, C.H., Cheng, Z.Y.
• Other Authors: ELECTRICAL ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Carrier lifetime; Chemical vapour deposition; Electron traps; Minority carriers; Silicon dioxide
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/81305
• Institution: National University of Singapore

Electronics Letters