A fast measurement technique of MOSFET Id-Vg characteristics

10.1109/LED.2005.861025

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Bibliographic Details
Main Authors:	Shen, C., Li, M.-F., Wang, X.P., Yeo, Y.-C., Kwong, D.-L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	CMOSFETs Reliability Semiconductor device measurements Trapping
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81867
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-81867
record_format	dspace
spelling	sg-nus-scholar.10635-818672023-10-26T08:07:21Z A fast measurement technique of MOSFET Id-Vg characteristics Shen, C. Li, M.-F. Wang, X.P. Yeo, Y.-C. Kwong, D.-L. ELECTRICAL & COMPUTER ENGINEERING CMOSFETs Reliability Semiconductor device measurements Trapping 10.1109/LED.2005.861025 IEEE Electron Device Letters 27 1 55-57 EDLED 2014-10-07T04:22:38Z 2014-10-07T04:22:38Z 2006-01 Article Shen, C., Li, M.-F., Wang, X.P., Yeo, Y.-C., Kwong, D.-L. (2006-01). A fast measurement technique of MOSFET Id-Vg characteristics. IEEE Electron Device Letters 27 (1) : 55-57. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2005.861025 07413106 http://scholarbank.nus.edu.sg/handle/10635/81867 000234397800019 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	CMOSFETs Reliability Semiconductor device measurements Trapping
spellingShingle	CMOSFETs Reliability Semiconductor device measurements Trapping Shen, C. Li, M.-F. Wang, X.P. Yeo, Y.-C. Kwong, D.-L. A fast measurement technique of MOSFET Id-Vg characteristics
description	10.1109/LED.2005.861025
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Shen, C. Li, M.-F. Wang, X.P. Yeo, Y.-C. Kwong, D.-L.
format	Article
author	Shen, C. Li, M.-F. Wang, X.P. Yeo, Y.-C. Kwong, D.-L.
author_sort	Shen, C.
title	A fast measurement technique of MOSFET Id-Vg characteristics
title_short	A fast measurement technique of MOSFET Id-Vg characteristics
title_full	A fast measurement technique of MOSFET Id-Vg characteristics
title_fullStr	A fast measurement technique of MOSFET Id-Vg characteristics
title_full_unstemmed	A fast measurement technique of MOSFET Id-Vg characteristics
title_sort	fast measurement technique of mosfet id-vg characteristics
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81867
_version_	1781784002654371840

A fast measurement technique of MOSFET Id-Vg characteristics

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