A fast measurement technique of MOSFET Id-Vg characteristics

10.1109/LED.2005.861025

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Bibliographic Details
Main Authors:	Shen, C., Li, M.-F., Wang, X.P., Yeo, Y.-C., Kwong, D.-L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	CMOSFETs Reliability Semiconductor device measurements Trapping
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81867
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Institution:	National University of Singapore

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