Enhancing leakage suppression in carbon-rich silicon junctions

• Main Authors: Tan, C.F., Chor, E.F., Lee, H., Quek, E., Chan, L.
• 其他作者: ELECTRICAL & COMPUTER ENGINEERING
• 格式: Article
• 出版: 2014
• 主題: Carbon; End of range (EOR); Junction leakage; Solid-phase epitaxial (SPE)
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/82295

10.1109/LED.2006.874127