Enhancing leakage suppression in carbon-rich silicon junctions

• Main Authors: Tan, C.F., Chor, E.F., Lee, H., Quek, E., Chan, L.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Subjects: Carbon; End of range (EOR); Junction leakage; Solid-phase epitaxial (SPE)
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/82295
• Institution: National University of Singapore

10.1109/LED.2006.874127