Enhancing leakage suppression in carbon-rich silicon junctions

Enhancing leakage suppression in carbon-rich silicon junctions

10.1109/LED.2006.874127

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Bibliographic Details
Main Authors: Tan, C.F., Chor, E.F., Lee, H., Quek, E., Chan, L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Carbon
End of range (EOR)
Junction leakage
Solid-phase epitaxial (SPE)
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82295
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/82295

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