NiSi2 formation through annealing of nickel and dysprosium stack on Si(100) and impact on effective Schottky barrier height

10.1063/1.4772710

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書目詳細資料
Main Authors: Lim, P.S.Y., Chi, D.Z., Zhou, Q., Yeo, Y.-C.
其他作者: ELECTRICAL & COMPUTER ENGINEERING
格式: Article
出版: 2014
在線閱讀:http://scholarbank.nus.edu.sg/handle/10635/82764
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機構: National University of Singapore