Ohmic contact properties and annealing effect for Au/Ni on p-Type P-Doped ZnO

10.1149/1.3166139

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Bibliographic Details
Main Authors: Hu, G., Gong, H., Chor, E.F.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82802
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Institution: National University of Singapore

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