Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications

Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications

10.1109/TED.2009.2030539

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Bibliographic Details
Main Authors: Chen, J.-D., Yang, J.-J., Wise, R., Steinmann, P., Yu, M.-B., Zhu, C., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Canceling effect
Capacitor
Metal-insulator-metal (MIM)
SiO2
Sm2O3
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82905
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/82905

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