Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications
10.1109/TED.2009.2030539
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sg-nus-scholar.10635-829052024-11-13T14:46:56Z Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications Chen, J.-D. Yang, J.-J. Wise, R. Steinmann, P. Yu, M.-B. Zhu, C. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING Canceling effect Capacitor Metal-insulator-metal (MIM) SiO2 Sm2O3 10.1109/TED.2009.2030539 IEEE Transactions on Electron Devices 56 11 2683-2691 IETDA 2014-10-07T04:34:54Z 2014-10-07T04:34:54Z 2009 Article Chen, J.-D., Yang, J.-J., Wise, R., Steinmann, P., Yu, M.-B., Zhu, C., Yeo, Y.-C. (2009). Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications. IEEE Transactions on Electron Devices 56 (11) : 2683-2691. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2009.2030539 00189383 http://scholarbank.nus.edu.sg/handle/10635/82905 000271019500040 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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Canceling effect Capacitor Metal-insulator-metal (MIM) SiO2 Sm2O3 |
| spellingShingle |
Canceling effect Capacitor Metal-insulator-metal (MIM) SiO2 Sm2O3 Chen, J.-D. Yang, J.-J. Wise, R. Steinmann, P. Yu, M.-B. Zhu, C. Yeo, Y.-C. Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications |
| description |
10.1109/TED.2009.2030539 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Chen, J.-D. Yang, J.-J. Wise, R. Steinmann, P. Yu, M.-B. Zhu, C. Yeo, Y.-C. |
| format |
Article |
| author |
Chen, J.-D. Yang, J.-J. Wise, R. Steinmann, P. Yu, M.-B. Zhu, C. Yeo, Y.-C. |
| author_sort |
Chen, J.-D. |
| title |
Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications |
| title_short |
Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications |
| title_full |
Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications |
| title_fullStr |
Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications |
| title_full_unstemmed |
Physical and electrical characterization of metal-insulator-metal capacitors with Sm2O3 and Sm2 O3/SiO2 laminated dielectrics for analog circuit applications |
| title_sort |
physical and electrical characterization of metal-insulator-metal capacitors with sm2o3 and sm2 o3/sio2 laminated dielectrics for analog circuit applications |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/82905 |
| _version_ |
1821222897961664512 |