Surface passivation using ultrathin AlN x film for Ge-metal-oxide-semiconductor devices with hafnium oxide gate dielectric

10.1063/1.1875733

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Bibliographic Details
Main Authors: Gao, F., Lee, S.J., Pan, J.S., Tang, L.J., Kwong, D.-L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83125
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-831252023-10-26T20:37:03Z Surface passivation using ultrathin AlN x film for Ge-metal-oxide-semiconductor devices with hafnium oxide gate dielectric Gao, F. Lee, S.J. Pan, J.S. Tang, L.J. Kwong, D.-L. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1875733 Applied Physics Letters 86 11 1-3 APPLA 2014-10-07T04:37:33Z 2014-10-07T04:37:33Z 2005-03-14 Article Gao, F., Lee, S.J., Pan, J.S., Tang, L.J., Kwong, D.-L. (2005-03-14). Surface passivation using ultrathin AlN x film for Ge-metal-oxide-semiconductor devices with hafnium oxide gate dielectric. Applied Physics Letters 86 (11) : 1-3. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1875733 00036951 http://scholarbank.nus.edu.sg/handle/10635/83125 000228050700099 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.1875733
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Gao, F.
Lee, S.J.
Pan, J.S.
Tang, L.J.
Kwong, D.-L.
format Article
author Gao, F.
Lee, S.J.
Pan, J.S.
Tang, L.J.
Kwong, D.-L.
spellingShingle Gao, F.
Lee, S.J.
Pan, J.S.
Tang, L.J.
Kwong, D.-L.
Surface passivation using ultrathin AlN x film for Ge-metal-oxide-semiconductor devices with hafnium oxide gate dielectric
author_sort Gao, F.
title Surface passivation using ultrathin AlN x film for Ge-metal-oxide-semiconductor devices with hafnium oxide gate dielectric
title_short Surface passivation using ultrathin AlN x film for Ge-metal-oxide-semiconductor devices with hafnium oxide gate dielectric
title_full Surface passivation using ultrathin AlN x film for Ge-metal-oxide-semiconductor devices with hafnium oxide gate dielectric
title_fullStr Surface passivation using ultrathin AlN x film for Ge-metal-oxide-semiconductor devices with hafnium oxide gate dielectric
title_full_unstemmed Surface passivation using ultrathin AlN x film for Ge-metal-oxide-semiconductor devices with hafnium oxide gate dielectric
title_sort surface passivation using ultrathin aln x film for ge-metal-oxide-semiconductor devices with hafnium oxide gate dielectric
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83125
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