Tunneling field-effect transistor: Effect of strain and temperature on tunneling current

10.1109/LED.2009.2026296

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Bibliographic Details
Main Authors:	Guo, P.-F., Yang, L.-T., Yang, Y., Fan, L., Han, G.-Q., Samudra, G.S., Yeo, Y.-C.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Double gate Strain Temperature Tunneling Tunneling field-effect transistor (TFET)
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/83232
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-83232
record_format	dspace
spelling	sg-nus-scholar.10635-832322023-10-29T20:28:07Z Tunneling field-effect transistor: Effect of strain and temperature on tunneling current Guo, P.-F. Yang, L.-T. Yang, Y. Fan, L. Han, G.-Q. Samudra, G.S. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING Double gate Strain Temperature Tunneling Tunneling field-effect transistor (TFET) 10.1109/LED.2009.2026296 IEEE Electron Device Letters 30 9 981-983 EDLED 2014-10-07T04:38:51Z 2014-10-07T04:38:51Z 2009 Article Guo, P.-F., Yang, L.-T., Yang, Y., Fan, L., Han, G.-Q., Samudra, G.S., Yeo, Y.-C. (2009). Tunneling field-effect transistor: Effect of strain and temperature on tunneling current. IEEE Electron Device Letters 30 (9) : 981-983. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2009.2026296 07413106 http://scholarbank.nus.edu.sg/handle/10635/83232 000269443000030 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Double gate Strain Temperature Tunneling Tunneling field-effect transistor (TFET)
spellingShingle	Double gate Strain Temperature Tunneling Tunneling field-effect transistor (TFET) Guo, P.-F. Yang, L.-T. Yang, Y. Fan, L. Han, G.-Q. Samudra, G.S. Yeo, Y.-C. Tunneling field-effect transistor: Effect of strain and temperature on tunneling current
description	10.1109/LED.2009.2026296
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Guo, P.-F. Yang, L.-T. Yang, Y. Fan, L. Han, G.-Q. Samudra, G.S. Yeo, Y.-C.
format	Article
author	Guo, P.-F. Yang, L.-T. Yang, Y. Fan, L. Han, G.-Q. Samudra, G.S. Yeo, Y.-C.
author_sort	Guo, P.-F.
title	Tunneling field-effect transistor: Effect of strain and temperature on tunneling current
title_short	Tunneling field-effect transistor: Effect of strain and temperature on tunneling current
title_full	Tunneling field-effect transistor: Effect of strain and temperature on tunneling current
title_fullStr	Tunneling field-effect transistor: Effect of strain and temperature on tunneling current
title_full_unstemmed	Tunneling field-effect transistor: Effect of strain and temperature on tunneling current
title_sort	tunneling field-effect transistor: effect of strain and temperature on tunneling current
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/83232
_version_	1781784338330812416

Tunneling field-effect transistor: Effect of strain and temperature on tunneling current

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