Asymmetric energy distribution of interface traps in germanium MOSFETs with HfO2 gate dielectric
10.1149/1.2986766
Saved in:
Main Authors: | , , , |
---|---|
Other Authors: | |
Format: | Conference or Workshop Item |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/83500 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
id |
sg-nus-scholar.10635-83500 |
---|---|
record_format |
dspace |
spelling |
sg-nus-scholar.10635-835002023-10-29T21:03:55Z Asymmetric energy distribution of interface traps in germanium MOSFETs with HfO2 gate dielectric Xie, R. Wu, N. Shen, C. Zhu, C. ELECTRICAL & COMPUTER ENGINEERING 10.1149/1.2986766 ECS Transactions 16 10 175-180 2014-10-07T04:41:56Z 2014-10-07T04:41:56Z 2008 Conference Paper Xie, R., Wu, N., Shen, C., Zhu, C. (2008). Asymmetric energy distribution of interface traps in germanium MOSFETs with HfO2 gate dielectric. ECS Transactions 16 (10) : 175-180. ScholarBank@NUS Repository. https://doi.org/10.1149/1.2986766 9781566776561 19385862 http://scholarbank.nus.edu.sg/handle/10635/83500 000273336700019 Scopus |
institution |
National University of Singapore |
building |
NUS Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NUS Library |
collection |
ScholarBank@NUS |
description |
10.1149/1.2986766 |
author2 |
ELECTRICAL & COMPUTER ENGINEERING |
author_facet |
ELECTRICAL & COMPUTER ENGINEERING Xie, R. Wu, N. Shen, C. Zhu, C. |
format |
Conference or Workshop Item |
author |
Xie, R. Wu, N. Shen, C. Zhu, C. |
spellingShingle |
Xie, R. Wu, N. Shen, C. Zhu, C. Asymmetric energy distribution of interface traps in germanium MOSFETs with HfO2 gate dielectric |
author_sort |
Xie, R. |
title |
Asymmetric energy distribution of interface traps in germanium MOSFETs with HfO2 gate dielectric |
title_short |
Asymmetric energy distribution of interface traps in germanium MOSFETs with HfO2 gate dielectric |
title_full |
Asymmetric energy distribution of interface traps in germanium MOSFETs with HfO2 gate dielectric |
title_fullStr |
Asymmetric energy distribution of interface traps in germanium MOSFETs with HfO2 gate dielectric |
title_full_unstemmed |
Asymmetric energy distribution of interface traps in germanium MOSFETs with HfO2 gate dielectric |
title_sort |
asymmetric energy distribution of interface traps in germanium mosfets with hfo2 gate dielectric |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/83500 |
_version_ |
1781784362020241408 |