Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs

• Main Authors: Shen, C., Li, M.F., Wang, X.P., Yu, H.Y., Feng, Y.P., Lim, A.T.-L., Yeo, Y.C., Chan, D.S.H., Kwong, D.L.
• Other Authors: PHYSICS
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/84003
• Institution: National University of Singapore

Technical Digest - International Electron Devices Meeting, IEDM