Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs

Technical Digest - International Electron Devices Meeting, IEDM

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Main Authors:	Shen, C., Li, M.F., Wang, X.P., Yu, H.Y., Feng, Y.P., Lim, A.T.-L., Yeo, Y.C., Chan, D.S.H., Kwong, D.L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/84003
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-84003
record_format	dspace
spelling	sg-nus-scholar.10635-840032024-11-14T21:07:40Z Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs Shen, C. Li, M.F. Wang, X.P. Yu, H.Y. Feng, Y.P. Lim, A.T.-L. Yeo, Y.C. Chan, D.S.H. Kwong, D.L. ELECTRICAL & COMPUTER ENGINEERING PHYSICS Technical Digest - International Electron Devices Meeting, IEDM 733-736 TDIMD 2014-10-07T04:47:40Z 2014-10-07T04:47:40Z 2004 Conference Paper Shen, C.,Li, M.F.,Wang, X.P.,Yu, H.Y.,Feng, Y.P.,Lim, A.T.-L.,Yeo, Y.C.,Chan, D.S.H.,Kwong, D.L. (2004). Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs. Technical Digest - International Electron Devices Meeting, IEDM : 733-736. ScholarBank@NUS Repository. 01631918 http://scholarbank.nus.edu.sg/handle/10635/84003 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Technical Digest - International Electron Devices Meeting, IEDM
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Shen, C. Li, M.F. Wang, X.P. Yu, H.Y. Feng, Y.P. Lim, A.T.-L. Yeo, Y.C. Chan, D.S.H. Kwong, D.L.
format	Conference or Workshop Item
author	Shen, C. Li, M.F. Wang, X.P. Yu, H.Y. Feng, Y.P. Lim, A.T.-L. Yeo, Y.C. Chan, D.S.H. Kwong, D.L.
spellingShingle	Shen, C. Li, M.F. Wang, X.P. Yu, H.Y. Feng, Y.P. Lim, A.T.-L. Yeo, Y.C. Chan, D.S.H. Kwong, D.L. Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs
author_sort	Shen, C.
title	Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs
title_short	Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs
title_full	Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs
title_fullStr	Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs
title_full_unstemmed	Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs
title_sort	negative u traps in hfo 2 gate dielectrics and frequency dependence of dynamic bti in mosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/84003
_version_	1821222058216914944

Negative U traps in HfO 2 gate dielectrics and frequency dependence of dynamic BTI in MOSFETs

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