Effect of strain on negative bias temperature instability of germanium p-channel field-effect transistor with high-κ gate dielectric
10.1109/IRPS.2010.5488674
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2014
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sg-nus-scholar.10635-836742024-11-08T16:46:16Z Effect of strain on negative bias temperature instability of germanium p-channel field-effect transistor with high-κ gate dielectric Liu, B. Lim, P.S.Y. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING Ge High-κ NBTI P-FET Strain Wafer bending 10.1109/IRPS.2010.5488674 IEEE International Reliability Physics Symposium Proceedings 1055-1057 2014-10-07T04:43:53Z 2014-10-07T04:43:53Z 2010 Conference Paper Liu, B., Lim, P.S.Y., Yeo, Y.-C. (2010). Effect of strain on negative bias temperature instability of germanium p-channel field-effect transistor with high-κ gate dielectric. IEEE International Reliability Physics Symposium Proceedings : 1055-1057. ScholarBank@NUS Repository. https://doi.org/10.1109/IRPS.2010.5488674 9781424454310 15417026 http://scholarbank.nus.edu.sg/handle/10635/83674 000287515600186 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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Ge High-κ NBTI P-FET Strain Wafer bending |
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Ge High-κ NBTI P-FET Strain Wafer bending Liu, B. Lim, P.S.Y. Yeo, Y.-C. Effect of strain on negative bias temperature instability of germanium p-channel field-effect transistor with high-κ gate dielectric |
| description |
10.1109/IRPS.2010.5488674 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Liu, B. Lim, P.S.Y. Yeo, Y.-C. |
| format |
Conference or Workshop Item |
| author |
Liu, B. Lim, P.S.Y. Yeo, Y.-C. |
| author_sort |
Liu, B. |
| title |
Effect of strain on negative bias temperature instability of germanium p-channel field-effect transistor with high-κ gate dielectric |
| title_short |
Effect of strain on negative bias temperature instability of germanium p-channel field-effect transistor with high-κ gate dielectric |
| title_full |
Effect of strain on negative bias temperature instability of germanium p-channel field-effect transistor with high-κ gate dielectric |
| title_fullStr |
Effect of strain on negative bias temperature instability of germanium p-channel field-effect transistor with high-κ gate dielectric |
| title_full_unstemmed |
Effect of strain on negative bias temperature instability of germanium p-channel field-effect transistor with high-κ gate dielectric |
| title_sort |
effect of strain on negative bias temperature instability of germanium p-channel field-effect transistor with high-κ gate dielectric |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/83674 |
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1821215079095336960 |