Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors

10.1109/VTSA.2007.378954

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Bibliographic Details
Main Authors:	Ang, K.-W., Chui, K.-J., Tung, C.-H., Samudra, G., Balasubramanian, N., Yeo, Y.-C.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/83698
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-836982015-01-17T16:31:46Z Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors Ang, K.-W. Chui, K.-J. Tung, C.-H. Samudra, G. Balasubramanian, N. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/VTSA.2007.378954 International Symposium on VLSI Technology, Systems, and Applications, Proceedings - 2014-10-07T04:44:10Z 2014-10-07T04:44:10Z 2007 Conference Paper Ang, K.-W.,Chui, K.-J.,Tung, C.-H.,Samudra, G.,Balasubramanian, N.,Yeo, Y.-C. (2007). Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors. International Symposium on VLSI Technology, Systems, and Applications, Proceedings : -. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/VTSA.2007.378954" target="_blank">https://doi.org/10.1109/VTSA.2007.378954</a> 1424405858 http://scholarbank.nus.edu.sg/handle/10635/83698 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	10.1109/VTSA.2007.378954
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Ang, K.-W. Chui, K.-J. Tung, C.-H. Samudra, G. Balasubramanian, N. Yeo, Y.-C.
format	Conference or Workshop Item
author	Ang, K.-W. Chui, K.-J. Tung, C.-H. Samudra, G. Balasubramanian, N. Yeo, Y.-C.
spellingShingle	Ang, K.-W. Chui, K.-J. Tung, C.-H. Samudra, G. Balasubramanian, N. Yeo, Y.-C. Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors
author_sort	Ang, K.-W.
title	Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors
title_short	Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors
title_full	Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors
title_fullStr	Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors
title_full_unstemmed	Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors
title_sort	enhanced carrier transport in strained bulk n-mosfets with silicon-carbon source/drain stressors
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/83698
_version_	1681089483779342336

Enhanced carrier transport in strained bulk N-MOSFETs with silicon-carbon source/drain stressors

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