Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application

Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application

10.1109/.2005.1469225

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Main Authors: Yang, T., Li, M.F., Shen, C., Ang, C.H., Zhu, C., Yeo, Y.C., Samudra, G., Rustagi, S.C., Yu, M.B., Kwong, D.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83730
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Institution: National University of Singapore
id sg-nus-scholar.10635-83730
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spelling sg-nus-scholar.10635-837302015-02-25T03:21:13Z Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application Yang, T. Li, M.F. Shen, C. Ang, C.H. Zhu, C. Yeo, Y.C. Samudra, G. Rustagi, S.C. Yu, M.B. Kwong, D.L. ELECTRICAL & COMPUTER ENGINEERING 10.1109/.2005.1469225 Digest of Technical Papers - Symposium on VLSI Technology 2005 92-93 DTPTE 2014-10-07T04:44:31Z 2014-10-07T04:44:31Z 2005 Conference Paper Yang, T.,Li, M.F.,Shen, C.,Ang, C.H.,Zhu, C.,Yeo, Y.C.,Samudra, G.,Rustagi, S.C.,Yu, M.B.,Kwong, D.L. (2005). Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application. Digest of Technical Papers - Symposium on VLSI Technology 2005 : 92-93. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/.2005.1469225" target="_blank">https://doi.org/10.1109/.2005.1469225</a> 07431562 http://scholarbank.nus.edu.sg/handle/10635/83730 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description 10.1109/.2005.1469225
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Yang, T.
Li, M.F.
Shen, C.
Ang, C.H.
Zhu, C.
Yeo, Y.C.
Samudra, G.
Rustagi, S.C.
Yu, M.B.
Kwong, D.L.
format Conference or Workshop Item
author Yang, T.
Li, M.F.
Shen, C.
Ang, C.H.
Zhu, C.
Yeo, Y.C.
Samudra, G.
Rustagi, S.C.
Yu, M.B.
Kwong, D.L.
spellingShingle Yang, T.
Li, M.F.
Shen, C.
Ang, C.H.
Zhu, C.
Yeo, Y.C.
Samudra, G.
Rustagi, S.C.
Yu, M.B.
Kwong, D.L.
Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application
author_sort Yang, T.
title Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application
title_short Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application
title_full Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application
title_fullStr Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application
title_full_unstemmed Fast and slow dynamic NBTI components in p-MOSFET with SiON dielectric and their impact on device life-time and circuit application
title_sort fast and slow dynamic nbti components in p-mosfet with sion dielectric and their impact on device life-time and circuit application
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83730
_version_ 1681089489753079808

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