Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs

Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs

Annual Proceedings - Reliability Physics (Symposium)

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Bibliographic Details
Main Authors: Shen, C., Yu, H.Y., Wang, X.P., Li, M.-F., Yeo, Y.-C., Chan, D.S.H., Bera, K.L., Kwong, D.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83747
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Institution: National University of Singapore
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Summary:Annual Proceedings - Reliability Physics (Symposium)

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