Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs

Annual Proceedings - Reliability Physics (Symposium)

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Main Authors:	Shen, C., Yu, H.Y., Wang, X.P., Li, M.-F., Yeo, Y.-C., Chan, D.S.H., Bera, K.L., Kwong, D.L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/83747
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-83747
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spelling	sg-nus-scholar.10635-837472015-01-31T14:20:39Z Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs Shen, C. Yu, H.Y. Wang, X.P. Li, M.-F. Yeo, Y.-C. Chan, D.S.H. Bera, K.L. Kwong, D.L. ELECTRICAL & COMPUTER ENGINEERING Annual Proceedings - Reliability Physics (Symposium) 601-602 ARLPB 2014-10-07T04:44:43Z 2014-10-07T04:44:43Z 2004 Conference Paper Shen, C.,Yu, H.Y.,Wang, X.P.,Li, M.-F.,Yeo, Y.-C.,Chan, D.S.H.,Bera, K.L.,Kwong, D.L. (2004). Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs. Annual Proceedings - Reliability Physics (Symposium) : 601-602. ScholarBank@NUS Repository. 00999512 http://scholarbank.nus.edu.sg/handle/10635/83747 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Annual Proceedings - Reliability Physics (Symposium)
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Shen, C. Yu, H.Y. Wang, X.P. Li, M.-F. Yeo, Y.-C. Chan, D.S.H. Bera, K.L. Kwong, D.L.
format	Conference or Workshop Item
author	Shen, C. Yu, H.Y. Wang, X.P. Li, M.-F. Yeo, Y.-C. Chan, D.S.H. Bera, K.L. Kwong, D.L.
spellingShingle	Shen, C. Yu, H.Y. Wang, X.P. Li, M.-F. Yeo, Y.-C. Chan, D.S.H. Bera, K.L. Kwong, D.L. Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs
author_sort	Shen, C.
title	Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs
title_short	Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs
title_full	Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs
title_fullStr	Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs
title_full_unstemmed	Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs
title_sort	frequency dependent dynamic charge trapping in hfo 2 and threshold voltage instability in mosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/83747
_version_	1681089492853719040

Frequency dependent dynamic charge trapping in HfO 2 and threshold voltage instability in MOSFETs

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