High mobility high-k/Ge pMOSFETs with 1 nm EOT-new concept on interface engineering and interface characterization
10.1109/IEDM.2008.4796703
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2014
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sg-nus-scholar.10635-837812015-02-25T16:34:27Z High mobility high-k/Ge pMOSFETs with 1 nm EOT-new concept on interface engineering and interface characterization Xie, R. Phung, T.H. He, W. Sun, Z. Yu, M. Cheng, Z. Zhu, C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/IEDM.2008.4796703 Technical Digest - International Electron Devices Meeting, IEDM - TDIMD 2014-10-07T04:45:06Z 2014-10-07T04:45:06Z 2008 Conference Paper Xie, R.,Phung, T.H.,He, W.,Sun, Z.,Yu, M.,Cheng, Z.,Zhu, C. (2008). High mobility high-k/Ge pMOSFETs with 1 nm EOT-new concept on interface engineering and interface characterization. Technical Digest - International Electron Devices Meeting, IEDM : -. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IEDM.2008.4796703" target="_blank">https://doi.org/10.1109/IEDM.2008.4796703</a> 9781424423781 01631918 http://scholarbank.nus.edu.sg/handle/10635/83781 NOT_IN_WOS Scopus |
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10.1109/IEDM.2008.4796703 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Xie, R. Phung, T.H. He, W. Sun, Z. Yu, M. Cheng, Z. Zhu, C. |
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Conference or Workshop Item |
author |
Xie, R. Phung, T.H. He, W. Sun, Z. Yu, M. Cheng, Z. Zhu, C. |
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Xie, R. Phung, T.H. He, W. Sun, Z. Yu, M. Cheng, Z. Zhu, C. High mobility high-k/Ge pMOSFETs with 1 nm EOT-new concept on interface engineering and interface characterization |
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Xie, R. |
title |
High mobility high-k/Ge pMOSFETs with 1 nm EOT-new concept on interface engineering and interface characterization |
title_short |
High mobility high-k/Ge pMOSFETs with 1 nm EOT-new concept on interface engineering and interface characterization |
title_full |
High mobility high-k/Ge pMOSFETs with 1 nm EOT-new concept on interface engineering and interface characterization |
title_fullStr |
High mobility high-k/Ge pMOSFETs with 1 nm EOT-new concept on interface engineering and interface characterization |
title_full_unstemmed |
High mobility high-k/Ge pMOSFETs with 1 nm EOT-new concept on interface engineering and interface characterization |
title_sort |
high mobility high-k/ge pmosfets with 1 nm eot-new concept on interface engineering and interface characterization |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/83781 |
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1681089499081211904 |