Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETs

10.1109/VLSIT.2007.4339746

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Main Authors: Lee, R.T.P., Liow, T.-Y., Tan, K.-M., Lim, A.E.-J., Ho, C.-S., Hoe, K.-M., Lai, M.Y., Osipowicz, T., Lo, G.-Q., Samudra, G., Chi, D.-Z., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/84017
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-840172023-10-29T23:28:41Z Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETs Lee, R.T.P. Liow, T.-Y. Tan, K.-M. Lim, A.E.-J. Ho, C.-S. Hoe, K.-M. Lai, M.Y. Osipowicz, T. Lo, G.-Q. Samudra, G. Chi, D.-Z. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING PHYSICS 10.1109/VLSIT.2007.4339746 Digest of Technical Papers - Symposium on VLSI Technology 108-109 DTPTE 2014-10-07T04:47:50Z 2014-10-07T04:47:50Z 2007 Conference Paper Lee, R.T.P., Liow, T.-Y., Tan, K.-M., Lim, A.E.-J., Ho, C.-S., Hoe, K.-M., Lai, M.Y., Osipowicz, T., Lo, G.-Q., Samudra, G., Chi, D.-Z., Yeo, Y.-C. (2007). Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETs. Digest of Technical Papers - Symposium on VLSI Technology : 108-109. ScholarBank@NUS Repository. https://doi.org/10.1109/VLSIT.2007.4339746 07431562 http://scholarbank.nus.edu.sg/handle/10635/84017 000250539900042 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1109/VLSIT.2007.4339746
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Lee, R.T.P.
Liow, T.-Y.
Tan, K.-M.
Lim, A.E.-J.
Ho, C.-S.
Hoe, K.-M.
Lai, M.Y.
Osipowicz, T.
Lo, G.-Q.
Samudra, G.
Chi, D.-Z.
Yeo, Y.-C.
format Conference or Workshop Item
author Lee, R.T.P.
Liow, T.-Y.
Tan, K.-M.
Lim, A.E.-J.
Ho, C.-S.
Hoe, K.-M.
Lai, M.Y.
Osipowicz, T.
Lo, G.-Q.
Samudra, G.
Chi, D.-Z.
Yeo, Y.-C.
spellingShingle Lee, R.T.P.
Liow, T.-Y.
Tan, K.-M.
Lim, A.E.-J.
Ho, C.-S.
Hoe, K.-M.
Lai, M.Y.
Osipowicz, T.
Lo, G.-Q.
Samudra, G.
Chi, D.-Z.
Yeo, Y.-C.
Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETs
author_sort Lee, R.T.P.
title Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETs
title_short Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETs
title_full Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETs
title_fullStr Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETs
title_full_unstemmed Novel epitaxial nickel aluminide-silicide with low Schottky-Barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETs
title_sort novel epitaxial nickel aluminide-silicide with low schottky-barrier and series resistance for enhanced performance of dopant-segregated source/drain n-channel mugfets
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/84017
_version_ 1781784413799972864