Structural analysis of metalorganic chemical vapor deposited AIN nucleation layers on Si (1 1 1)

10.1016/j.jcrysgro.2004.04.083

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Bibliographic Details
Main Authors:	Zang, K.Y., Wang, L.S., Chua, S.J., Thompson, C.V.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Subjects:	A1. Atomic force microscopy A1. Transmission electron microscopy B1. AlN B1. GaN
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/84238
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-842382023-10-30T22:53:38Z Structural analysis of metalorganic chemical vapor deposited AIN nucleation layers on Si (1 1 1) Zang, K.Y. Wang, L.S. Chua, S.J. Thompson, C.V. ELECTRICAL & COMPUTER ENGINEERING A1. Atomic force microscopy A1. Transmission electron microscopy B1. AlN B1. GaN 10.1016/j.jcrysgro.2004.04.083 Journal of Crystal Growth 268 3-4 SPEC. ISS. 515-520 JCRGA 2014-10-07T04:50:23Z 2014-10-07T04:50:23Z 2004-08-01 Conference Paper Zang, K.Y., Wang, L.S., Chua, S.J., Thompson, C.V. (2004-08-01). Structural analysis of metalorganic chemical vapor deposited AIN nucleation layers on Si (1 1 1). Journal of Crystal Growth 268 (3-4 SPEC. ISS.) : 515-520. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jcrysgro.2004.04.083 00220248 http://scholarbank.nus.edu.sg/handle/10635/84238 000223087000034 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	A1. Atomic force microscopy A1. Transmission electron microscopy B1. AlN B1. GaN
spellingShingle	A1. Atomic force microscopy A1. Transmission electron microscopy B1. AlN B1. GaN Zang, K.Y. Wang, L.S. Chua, S.J. Thompson, C.V. Structural analysis of metalorganic chemical vapor deposited AIN nucleation layers on Si (1 1 1)
description	10.1016/j.jcrysgro.2004.04.083
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Zang, K.Y. Wang, L.S. Chua, S.J. Thompson, C.V.
format	Conference or Workshop Item
author	Zang, K.Y. Wang, L.S. Chua, S.J. Thompson, C.V.
author_sort	Zang, K.Y.
title	Structural analysis of metalorganic chemical vapor deposited AIN nucleation layers on Si (1 1 1)
title_short	Structural analysis of metalorganic chemical vapor deposited AIN nucleation layers on Si (1 1 1)
title_full	Structural analysis of metalorganic chemical vapor deposited AIN nucleation layers on Si (1 1 1)
title_fullStr	Structural analysis of metalorganic chemical vapor deposited AIN nucleation layers on Si (1 1 1)
title_full_unstemmed	Structural analysis of metalorganic chemical vapor deposited AIN nucleation layers on Si (1 1 1)
title_sort	structural analysis of metalorganic chemical vapor deposited ain nucleation layers on si (1 1 1)
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/84238
_version_	1781784434803998720

Structural analysis of metalorganic chemical vapor deposited AIN nucleation layers on Si (1 1 1)

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