AES analysis of silicon nitride formation by 10 keV N+ and N+ 2 ion implantation

10.1016/S0042-207X(96)00220-5

Saved in:
Bibliographic Details
Main Authors: Pan, J.S., Wee, A.T.S., Huan, C.H.A., Tan, H.S., Tan, K.L.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/95738
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Be the first to leave a comment!
You must be logged in first