Analysis of high-power devices using proton beam induced currents
Microelectronics Reliability
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sg-nus-scholar.10635-957722015-01-20T01:19:38Z Analysis of high-power devices using proton beam induced currents Zmeck, M. Osipowicz, T. Watt, F. Niedernostheide, F. Schulze, H.-J. Fiege, G.B.M. Balk, L. PHYSICS Microelectronics Reliability 40 8-10 1413-1418 MCRLA 2014-10-16T09:15:38Z 2014-10-16T09:15:38Z 2000 Article Zmeck, M.,Osipowicz, T.,Watt, F.,Niedernostheide, F.,Schulze, H.-J.,Fiege, G.B.M.,Balk, L. (2000). Analysis of high-power devices using proton beam induced currents. Microelectronics Reliability 40 (8-10) : 1413-1418. ScholarBank@NUS Repository. 00262714 http://scholarbank.nus.edu.sg/handle/10635/95772 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
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Singapore |
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ScholarBank@NUS |
| description |
Microelectronics Reliability |
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PHYSICS |
| author_facet |
PHYSICS Zmeck, M. Osipowicz, T. Watt, F. Niedernostheide, F. Schulze, H.-J. Fiege, G.B.M. Balk, L. |
| format |
Article |
| author |
Zmeck, M. Osipowicz, T. Watt, F. Niedernostheide, F. Schulze, H.-J. Fiege, G.B.M. Balk, L. |
| spellingShingle |
Zmeck, M. Osipowicz, T. Watt, F. Niedernostheide, F. Schulze, H.-J. Fiege, G.B.M. Balk, L. Analysis of high-power devices using proton beam induced currents |
| author_sort |
Zmeck, M. |
| title |
Analysis of high-power devices using proton beam induced currents |
| title_short |
Analysis of high-power devices using proton beam induced currents |
| title_full |
Analysis of high-power devices using proton beam induced currents |
| title_fullStr |
Analysis of high-power devices using proton beam induced currents |
| title_full_unstemmed |
Analysis of high-power devices using proton beam induced currents |
| title_sort |
analysis of high-power devices using proton beam induced currents |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/95772 |
| _version_ |
1681091538867716096 |