Analysis of high-power devices using proton beam induced currents
Microelectronics Reliability
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Main Authors: | Zmeck, M., Osipowicz, T., Watt, F., Niedernostheide, F., Schulze, H.-J., Fiege, G.B.M., Balk, L. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/95772 |
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Institution: | National University of Singapore |
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