Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study
10.1063/1.2830814
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2014
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sg-nus-scholar.10635-970872023-10-26T21:57:28Z Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study Zheng, Y. Wee, A.T.S. Ong, Y.C. Pey, K.L. Troadec, C. O'Shea, S.J. Chandrasekhar, N. PHYSICS 10.1063/1.2830814 Applied Physics Letters 92 1 - APPLA 2014-10-16T09:31:07Z 2014-10-16T09:31:07Z 2008 Article Zheng, Y., Wee, A.T.S., Ong, Y.C., Pey, K.L., Troadec, C., O'Shea, S.J., Chandrasekhar, N. (2008). Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study. Applied Physics Letters 92 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2830814 00036951 http://scholarbank.nus.edu.sg/handle/10635/97087 000252284200121 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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| description |
10.1063/1.2830814 |
| author2 |
PHYSICS |
| author_facet |
PHYSICS Zheng, Y. Wee, A.T.S. Ong, Y.C. Pey, K.L. Troadec, C. O'Shea, S.J. Chandrasekhar, N. |
| format |
Article |
| author |
Zheng, Y. Wee, A.T.S. Ong, Y.C. Pey, K.L. Troadec, C. O'Shea, S.J. Chandrasekhar, N. |
| spellingShingle |
Zheng, Y. Wee, A.T.S. Ong, Y.C. Pey, K.L. Troadec, C. O'Shea, S.J. Chandrasekhar, N. Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study |
| author_sort |
Zheng, Y. |
| title |
Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study |
| title_short |
Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study |
| title_full |
Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study |
| title_fullStr |
Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study |
| title_full_unstemmed |
Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study |
| title_sort |
localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: a comparative study |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/97087 |
| _version_ |
1781786599957200896 |