New multiple-function logic family

by Tan, Y.K., Lim, Y.C., Kwok, C.Y., Ling, C.H.
Published 2014

Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures

by Ling, C.H., Kwok, C.Y., Chan, E.G., Tay, T.M.
Published 2014

New multiple-function logic family

by Tan, Y.K., Lim, Y.C., Kwok, C.Y., Ling, C.H.
Published 2014

Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation

by Cho, B.J., Kim, S.J., Ling, C.H., Joo, M.-S., Yeo, I.-S.
Published 2014

Logarithmic time dependence of pMOSFET degradation observed from gate capacitance

by Ling, C.H., Yeow, Y.T., Ah, L.K., Yung, W.H., Choi, W.K.
Published 2014

Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides

by Ang, C.-H., Ling, C.-H., Cho, B.-J., Kim, S.-J., Cheng, Z.-Y.
Published 2014

Radiation-induced leakage current of ultra-thin gate oxide under X-ray lithography conditions

by Cho, Byung Jin, Kim, Sun Jung, Ling, C.H., Joo, Moon Sig, Yeo, In Seok
Published 2014

Logarithmic time dependence of pMOSFET degradation observed from gate capacitance

by Ling, C.H., Yeow, Y.T., Ah, L.K., Yung, W.H., Choi, W.K.
Published 2014

Radiation-induced leakage current of ultra-thin gate oxide under X-ray lithography conditions

by Cho, Byung Jin, Kim, Sun Jung, Ling, C.H., Joo, Moon Sig, Yeo, In Seok
Published 2014

Hot-electron degradation in NMOSFET's: Results from temperature anneal

by Ling, C.H., Ah, L.K., Choi, W.K., Tan, S.E., Ang, D.S.
Published 2014

Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides

by Ang, C.-H., Ling, C.-H., Cho, B.-J., Kim, S.-J., Cheng, Z.-Y.
Published 2014

Recombination lifetime in silicon from laser microwave photoconductance decay measurement

by Ling, C.H., Teoh, H.K., Choi, W.K., Zhou, T.Q., Ah, L.K.
Published 2014

Recombination lifetime in silicon from laser microwave photoconductance decay measurement

by Ling, C.H., Teoh, H.K., Choi, W.K., Zhou, T.Q., Ah, L.K.
Published 2014

Structural and electrical studies of radio frequency sputtered hydrogenated amorphous silicon carbide films

by Choi, W.K., Loo, F.L., Ling, C.H., Loh, F.C., Tan, K.L.
Published 2014

Annealing of Fowler-Nordheim stress-induced leakage currents in thin silicon dioxide films

by Ang, C.H., Ling, C.H., Cheng, Z.Y., Kim, S.J., Cho, B.J.
Published 2014

Comparative study of radiation- and stress-induced leakage currents in thin gate oxides

by Ang, C.H., Ling, C.H., Cheng, Z.Y., Kim, S.J., Cho, B.J.
Published 2014

The efficiency of electric bus shuttle services in UTM campus: a pilot study

by Abas, M. A., Ardani, M. I., Mohamad, M., Ling, C. H., Latif, S. N. A., Mohamad, S. M. F. S., Halim, A. M.
Published 2019

Reliability of thin gate oxides irradiated under X-ray lithography conditions

by Cho, B.J., Kim, S.J., Ang, C.H., Ling, C.H., Joo, M.S., Yeo, I.S.
Published 2014

Structural properties of amorphous silicon carbide films by plasma-enhanced chemical vapor deposition

by Choi, W.K., Chan, Y.M., Ling, C.H., Lee, Y., Gopalakrishnan, R., Tan, K.L.
Published 2014

The contribution of management of change to process safety accident in the chemical process industry

by Piong, H. S., Chin, K. Y., Bakar, H. T. A., Ling, C. H., Kidam, K., Ali, M. W., Hassim, M. H., Kamarden, H.
Published 2017