A new insight into the degradation behavior of the LDD N-MOSFET during dynamic hot-carrier stressing

由 Ang, D.S.
出版 2014

A unified model for the self-limiting hot-carrier degradation in LDD n-MOSFET's

由 Ang, D.S., Ling, C.H.
出版 2014

A reassessment of ac hot-carrier degradation in deep-submicrometer LDD N-MOSFET

由 Ang, D.S., Ling, C.H.
出版 2014

On the time-dependent degradation of LDD n-MOSFETs under hot-carrier stress

由 Ang, D.S., Ling, C.H.
出版 2014

The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFET's

由 Ang, D.S., Ling, C.H.
出版 2014

Effects of tungsten polycidation on the hot-carrier degradation in buried-channel LDD p-MOSFET's

由 Ang, D.S., Ling, C.H.
出版 2014

A novel experimental technique for the lateral profiling of oxide and interface state charges in hot-hole degraded N-MOSFET's

由 Ang, D.S., Ling, C.H.
出版 2014

On the dominant interface trap generation process during hot-carrier stressing

由 Ang, D.S., Ling, C.H.
出版 2014

A New Model for the Post-Stress Interface Trap Generation in Hot-Carrier Stressed P-MOSFET's

由 Ang, D.S., Ling, C.H.
出版 2014

A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement

由 Ang, D.S., Ling, C.H.
出版 2014

A comparison of hot-carrier degradation in tungsten polycide gate and poly gate p-MOSFETs

由 Ang, D.S., Ling, C.H.
出版 2014

Evidence of two distinct degradation mechanisms from temperature dependence of negative bias stressing of the ultrathin gate p-MOSFET

由 Ang, D.S., Wang, S., Ling, C.H.
出版 2014

Extraction of channel length in 0.1 μm NMOSFET by gate to drain capacitance

由 Ling, C.H., Ang, D.S., Dutoit, M.
出版 2014

Nonlocal hot-electron injection as the mechanism for the predominant source-side gate oxide degradation in CHE-stressed deep submicrometer n-MOSFETs

由 Ang, D.S., Liao, H., Ling, C.H.
出版 2014

A comprehensive study of indium implantation-induced damage in deep submicrometer nMOSFET: Device characterization and damage assessment

由 Liao, H., Ang, D.S., Ling, C.H.
出版 2014

Generation-Recombination Noise in the Near Fully Depleted SIMOX SOI n-MOSFET - Physical Characteristics and Modeling

由 Ang, D.S., Lun, Z., Ling, C.H.
出版 2014

Study of hot-carrier degradation in submicrometer LDD NMOSFET's from 1 f noise and charge pumping current measurements at different temperature anneals

由 Ang, D.S., Ling, C.H., Yeow, Y.T.
出版 2014

Generation-recombination noise in the near fully depleted SIMOX N-MOSFET operating in the linear region

由 Ang, D.S., Lun, Z., Ling, C.H.
出版 2014

Effects of measurement frequency and temperature anneal on differential gate capacitance spectra observed in hot carrier stressed MOSFET's

由 Ling, C.H., Ang, D.S., Tan, S.E.
出版 2014

Effects of tungsten silicidation on Fowler-Nordheim tunnelling current and charge trapping in polysilicon-oxide-silicon capacitors

由 Ling, C.H., Ooi, J.A., Ang, D.S.
出版 2014