High-order least-square-based finite-difference–finite-volume method for simulation of incompressible thermal flows on arbitrary grids

by Liu, YY, Zhang, HW, Yang, LM, Shu, C
Published 2020

An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes

by Pey, K.L., Chim, W.K., Koh, L.S., Liu, Y.Y., Chew, S.Y.C.
Published 2014

Yellow luminescence imaging of epitaxial lateral overgrown GaN using ionoluminescence

by Teo, E.J., Bettiol, A.A., Osipowicz, T., Hao, M.S., Chua, S.J., Liu, Y.Y.
Published 2014

Cathodoluminescence microscopy of semiconductor devices using a novel detector with high collection and backscattered electron rejection efficiency

by Phang, J.C.H., Chan, D.S.H., Chim, W.K., Liu, Y.Y., Liu, X.
Published 2014

Depth-resolved luminescence imaging of epitaxial lateral overgrown GaN using ionoluminescence

by Teo, E.J., Bettiol, A.A., Osipowicz, T., Hao, M., Chua, S.J., Liu, Y.Y.
Published 2014

Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devices

by Chan, D.S.H., Phang, J.C.H., Chim, W.K., Liu, Y.Y., Tao, J.M.
Published 2014

New spectroscopic photon emission microscope system for semiconductor device analysis

by Liu, Y.Y., Tao, J.M., Chan, D.S.H., Phang, J.C.H., Chim, W.K.
Published 2014

High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capability

by Tao, J.M., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y.
Published 2014

Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope

by Tao, J.M., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y.
Published 2014

High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capability

by Tao, J.M., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y.
Published 2014

New spectroscopic photon emission microscope system for semiconductor device analysis

by Liu, Y.Y., Tao, J.M., Chan, D.S.H., Phang, J.C.H., Chim, W.K.
Published 2014

Microtomography and improved resolution in cathodoluminescence microscopy using confocal mirror optics

by Chan, D.S.H., Liu, Y.Y., Phang, J.C.H., Rau, E., Sennov, R., Gostev, A.V.
Published 2014

Study on LED degradation using CL, EBIC and a two-diode parameter extraction model

by Xiao, H., Liu, Y.Y., Phang, J.C.H., Chan, D.S.H., Chim, W.K., Yan, K.P.
Published 2014

Can physical analysis aid in device characterization?

by Chan, D.S.H., Chim, W.K., Phang, J.C.H., Liu, Y.Y., Ng, T.H., Xiao, H.
Published 2014

Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor

by Wittpahl, V., Liu, Y.Y., Chan, D.S.H., Chim, W.K., Phang, J.C.H., Balk, L.J., Yan, K.P.
Published 2014

Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis

by Ng, T.H., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y., Lou, C.L., Leang, S.E., Tao, J.M.
Published 2014

Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis

by Ng, T.H., Chim, W.K., Chan, D.S.H., Phang, J.C.H., Liu, Y.Y., Lou, C.L., Leang, S.E., Tao, J.M.
Published 2014