Surface roughening effect in sub-keV SIMS depth profiling

بواسطة Liu, R., Ng, C.M., Wee, A.T.S.
منشور في 2014

Characterization of biaxial stressed silicon by spectroscopic ellipsometry and synchrotron x-ray scattering

بواسطة Wong, T.K.S., Gong, Y., Yang, P., Ng, C.M.
منشور في 2014

Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f

بواسطة Ng, C.M., Wee, A.T.S., Huan, C.H.A., See, A.
منشور في 2014

Analyzing pre-fetching in large-scale visual simulation

بواسطة Ng, C.-M., Nguyen, C.-T., Tran, D.-N., Tan, T.-S., Yeow, S.-W.
منشور في 2013

Effects of oxygen flooding on crater bottom composition and roughness in ultrashallow secondary ion mass spectrometry depth profiling

بواسطة Ng, C.M., Wee, A.T.S., Huan, C.H.A., See, A.
منشور في 2014

Ultra shallow secondary ion mass spectrometry depth profiling: Limitation of sample rotation in improving depth resolution

بواسطة Ng, C.M., Wee, A.T.S., Huan, C.H.A., See, A.
منشور في 2014

SIMS backside depth profiling of ultrashallow implants using silicon-on-insulator substrates

بواسطة Yeo, K.L., Wee, A.T.S., Liu, R., Ng, C.M., See, A.
منشور في 2014

SIMS backside depth profiling of ultra shallow implants

بواسطة Yeo, K.L., Wee, A.T.S., See, A., Liu, R., Ng, C.M.
منشور في 2014

Mechanism of room temperature ferromagnetism in ZnO doped with Al

بواسطة Ma, Y.W., Ding, J., Yi, J.B., Zhang, H.T., Ng, C.M.
منشور في 2014

Room temperature ferromagnetism in Al-doped/Al2O 3-doped ZnO film

بواسطة Ma, Y.W., Ding, J., Ran, M., Huang, X.L., Ng, C.M.
منشور في 2014

Dual nanowire silicon MOSFET with silicon bridge and TaN gate

بواسطة Theng, A. L., Goh, Wang Ling, Ng, C. M., Chan, L., Lo, Guo-Qiang
منشور في 2010

An interface dipole predictive model for high-k dielectric/semiconductor heterostructures using the concept of the dipole neutrality point

بواسطة Liu, Z.Q., Chim, W.K., Chiam, S.Y., Pan, J.S., Ng, C.M.
منشور في 2014

Growth of carbon nanotubes on carbon/cobalt films with different sp 2/sp3 ratios

بواسطة Xu, N, Tsang, S.H, Tay, B.K, Teo, E.H.T, Ng, C.M
منشور في 2020

Thermal stability improvement of the lanthanum aluminate/silicon interface using a thin yttrium interlayer

بواسطة Liu, Z.Q., Chiam, S.Y., Chim, W.K., Pan, J.S., Ng, C.M.
منشور في 2014

Effects of thermal annealing on the band alignment of lanthanum aluminate on silicon investigated by x-ray photoelectron spectroscopy

بواسطة Liu, Z.Q., Chiam, S.Y., Chim, W.K., Pan, J.S., Ng, C.M.
منشور في 2014

Ambiguity in the magnitude and direction of the derived interface dipole in lanthanum aluminate heterostructures: Implications and proposed solution

بواسطة Liu, Z.Q., Chim, W.K., Chiam, S.Y., Pan, J.S., Ng, C.M.
منشور في 2014

Formation of the yttrium/germanium interface: Fermi-level pinning and intermixing at room temperature

بواسطة Liu, Z.Q., Chim, W.K., Chiam, S.Y., Pan, J.S., Ng, C.M.
منشور في 2014

Carrier transport characteristics of strained N-MOSFET featuring channel proximate silicon-carbon source/drain stressors for performance boost

بواسطة Koh, S.-M., Zhang, P., Ren, S.-F., Ng, C.-M., Samudra, G.S., Yeo, Y.-C.
منشور في 2014

Evaluating the use of electronegativity in band alignment models through the experimental slope parameter of lanthanum aluminate heterostructures

بواسطة Liu, Z.Q., Chim, W.K., Chiam, S.Y., Pan, J.S., Ng, C.M.
منشور في 2014

Study on thermal stability of plasma-PH3 passivated HfAlO/In0.53Ga0.47 as gate stack for advanced metal-oxide-semiconductor field effect transistor

بواسطة Suleiman, S.A., Oh, H.J., Du, A., Ng, C.M., Lee, S.J.
منشور في 2014