Analysis and reduction of mismatch in silicon neurons

• Main Authors: Shuo, Sun, Basu, Arindam
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/100795; http://hdl.handle.net/10220/18170
• Institution: Nanyang Technological University

In this paper, we describe a methodical approach for reducing errors due to mismatch in neuron circuits. We chose the neuron's current-frequency (f-i) curve as the desired output and use a sensitivity analysis to determine which transistors contribute most significantly to its variation. This a...