Analysis and reduction of mismatch in silicon neurons

Analysis and reduction of mismatch in silicon neurons

In this paper, we describe a methodical approach for reducing errors due to mismatch in neuron circuits. We chose the neuron's current-frequency (f-i) curve as the desired output and use a sensitivity analysis to determine which transistors contribute most significantly to its variation. This a...

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書目詳細資料
Main Authors:	Shuo, Sun, Basu, Arindam
其他作者:	School of Electrical and Electronic Engineering
格式:	Conference or Workshop Item
語言:	English
出版:	2013
主題:	DRNTU::Engineering::Electrical and electronic engineering
在線閱讀:	https://hdl.handle.net/10356/100795 http://hdl.handle.net/10220/18170
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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