Applications of higher-order phase shifting algorithms for multiple-wavelength metrology
Multiple-wavelength interferometric techniques have been successfully used for large step-height and large deformation measurements. Also it could resolve the step height between smooth and rough surfaces which is not possible with single wavelength interferometry. Temporal phase shifting algorithm,...
Saved in:
Main Authors: | , |
---|---|
其他作者: | |
格式: | Conference or Workshop Item |
語言: | English |
出版: |
2019
|
主題: | |
在線閱讀: | https://hdl.handle.net/10356/104906 http://hdl.handle.net/10220/49473 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
成為第一個發表評論!