Decapsulation of 3D multi-die stacked package
Although a combination of laser, mechanical and chemical techniques can be used to expose a very large and thin die from a multi-die stacked package, package warping and die crack occur in the process of gaining access to each die. The aim of this paper is to investigate the sample preparation techn...
Saved in:
Main Authors: | Kor, Katherine Hwee Boon, Liu, Q., Siah, Yu Wen, Gan, Chee Lip |
---|---|
Other Authors: | School of Materials Science and Engineering |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2020
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/143489 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Sample preparation for deprocessing of 3D multi-die stacked package
by: Kor, Katherine Hwee Boon, et al.
Published: (2020) -
Hardware security assessment through repair of damaged device
by: Sim, Siang Yee, et al.
Published: (2024) -
Laser focus depth adaptation for decapsulation of copper wirebonded devices
by: Kor, Katherine Hwee Boon, et al.
Published: (2015) -
Temperature control with a thermoelectric cooler (TEC) during laser decapsulation of plastic packages
by: Kor, H. B., et al.
Published: (2012) -
Decapsulation of IC packages with silver wire bonds for failure analysis
by: Matthews, Lynzen
Published: (2023)