Evaluation of fan-out wafer level package strength
Purpose: The fan-out wafer level package (FOWLP) becomes more and more attractive and popular because of its flexibility to integrate diverse devices into a very small form factor. The strength of ultrathin FOWLP is low, and the low package strength often leads to crack issues. This paper aims to st...
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sg-ntu-dr.10356-1502342021-06-10T02:33:47Z Evaluation of fan-out wafer level package strength Xu, Cheng Zhong, Zhao-Wei Choi, Won-kyoung School of Mechanical and Aerospace Engineering Engineering::Mechanical engineering Advanced Packaging Fan-out Wafer Level Package Purpose: The fan-out wafer level package (FOWLP) becomes more and more attractive and popular because of its flexibility to integrate diverse devices into a very small form factor. The strength of ultrathin FOWLP is low, and the low package strength often leads to crack issues. This paper aims to study the strength of thin FOWLP because the low package strength may lead to the reliability issue of package crack. Design/methodology/approach: This paper uses the experimental method (three-point bending test) and finite element method (ANSYS simulation software) to evaluate the FOWLP strength. Two theoretical models of FOWLP strength are proposed. These two models are based on the location of FOWLP initial fracture point. Findings: The results show that the backside protection tape does not have the ability to enhance the FOWLP strength, and the strength of over-molded structure FOWLP is superior to that of other structure FOWLPs with the same thickness level. Originality/value: There is ample research about the silicon strength and silicon die strength. However, there is little research about the package level strength and no research about the FOWLP strength. The FOWLP is made up of various materials. The effect of individual component and external environment on the FOWLP strength is uncertain. Therefore, the study of strength behavior of FOWLP is significant. Economic Development Board (EDB) The financial support to this research is provided by the Industrial Postgraduate Programme research grant of Economic Development Board (EDB), Singapore. The authors are grateful for the support of EDB Singapore and STATS ChipPAC Ltd. 2021-06-10T02:33:46Z 2021-06-10T02:33:46Z 2019 Journal Article Xu, C., Zhong, Z. & Choi, W. (2019). Evaluation of fan-out wafer level package strength. Microelectronics International, 36(2), 54-61. https://dx.doi.org/10.1108/MI-06-2018-0040 1356-5362 https://hdl.handle.net/10356/150234 10.1108/MI-06-2018-0040 2-s2.0-85062546467 2 36 54 61 en Microelectronics International © 2019 Emerald Publishing Limited. All rights reserved. |
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Engineering::Mechanical engineering Advanced Packaging Fan-out Wafer Level Package Xu, Cheng Zhong, Zhao-Wei Choi, Won-kyoung Evaluation of fan-out wafer level package strength |
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Purpose: The fan-out wafer level package (FOWLP) becomes more and more attractive and popular because of its flexibility to integrate diverse devices into a very small form factor. The strength of ultrathin FOWLP is low, and the low package strength often leads to crack issues. This paper aims to study the strength of thin FOWLP because the low package strength may lead to the reliability issue of package crack. Design/methodology/approach: This paper uses the experimental method (three-point bending test) and finite element method (ANSYS simulation software) to evaluate the FOWLP strength. Two theoretical models of FOWLP strength are proposed. These two models are based on the location of FOWLP initial fracture point. Findings: The results show that the backside protection tape does not have the ability to enhance the FOWLP strength, and the strength of over-molded structure FOWLP is superior to that of other structure FOWLPs with the same thickness level. Originality/value: There is ample research about the silicon strength and silicon die strength. However, there is little research about the package level strength and no research about the FOWLP strength. The FOWLP is made up of various materials. The effect of individual component and external environment on the FOWLP strength is uncertain. Therefore, the study of strength behavior of FOWLP is significant. |
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School of Mechanical and Aerospace Engineering |
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School of Mechanical and Aerospace Engineering Xu, Cheng Zhong, Zhao-Wei Choi, Won-kyoung |
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Article |
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Xu, Cheng Zhong, Zhao-Wei Choi, Won-kyoung |
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Xu, Cheng |
title |
Evaluation of fan-out wafer level package strength |
title_short |
Evaluation of fan-out wafer level package strength |
title_full |
Evaluation of fan-out wafer level package strength |
title_fullStr |
Evaluation of fan-out wafer level package strength |
title_full_unstemmed |
Evaluation of fan-out wafer level package strength |
title_sort |
evaluation of fan-out wafer level package strength |
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2021 |
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https://hdl.handle.net/10356/150234 |
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1702431285838872576 |