Microstructure and through-film electrical characteristics of vertically aligned amorphous carbon films
The microstructure and electrical properties of in-situ annealed carbon films is studied in this paper. In-situ annealing (150 °C to 600 °C) was done during the deposition of carbon films with −300 V substrate bias. Transmission electron microscopy and two points electrical probing studies were perf...
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Main Authors: | Tan, Chong Wei, Shakerzadeh, Maziar, Teo, Edwin Hang Tong, Tay, Beng Kang |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Article |
Language: | English |
Published: |
2021
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/151193 |
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Institution: | Nanyang Technological University |
Language: | English |
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