Process development of nanowires for off-chip interconnects

Nickel nanowires with solder cap are successfully fabricated on the test chip with well defined location. The location of the nanowires on the test chip can be pre-determined by using patterned silicon dioxide as the protective layer. The developed fabrication process of nanowires can be easily adap...

全面介紹

Saved in:
書目詳細資料
主要作者: Chong, Ser Choong.
其他作者: School of Materials Science & Engineering
格式: Theses and Dissertations
出版: 2008
主題:
在線閱讀:http://hdl.handle.net/10356/5123
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!