Built-in electric field enhancement/retardation on intermixing
The built-in electric field may impose a drift on charged point defects and may thus enhance or retard the intermixing during annealing. Electric field is built-in near the surface due to the pinning of surface Fermi level after argon plasma treatment on InP surfaces of InP/InGaAs quantum well sampl...
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Main Authors: | Xu, C. D., Chin, Mee Koy, Mei, Ting, Dong, Jian Rong, Chua, Soo Jin |
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其他作者: | School of Electrical and Electronic Engineering |
格式: | Article |
語言: | English |
出版: |
2010
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在線閱讀: | https://hdl.handle.net/10356/90694 http://hdl.handle.net/10220/6417 |
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