Built-in electric field enhancement/retardation on intermixing

The built-in electric field may impose a drift on charged point defects and may thus enhance or retard the intermixing during annealing. Electric field is built-in near the surface due to the pinning of surface Fermi level after argon plasma treatment on InP surfaces of InP/InGaAs quantum well sampl...

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Main Authors: Xu, C. D., Chin, Mee Koy, Mei, Ting, Dong, Jian Rong, Chua, Soo Jin
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2010
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在線閱讀:https://hdl.handle.net/10356/90694
http://hdl.handle.net/10220/6417
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